 |
Product flyer Spectrometer comparison |
|||||
| ARYELLE 150 | ARYELLE 200 | ARYELLE 400 | DEMON | ELIAS | ||
| f/7 | f/10 | f/10 | f/10 | f/50 | Aperture | |
| 5,000-11,000 | 12,000 | 9,000-35,000 | 75,000-150,000 | 2.5 Mio.-10 Mio. | spectral resolution capability |
|
| 190-1,100 nm | 175-1,100 nm | 175-1,100 nm | 175-1,100 nm | 157-1,100 nm | max. Wavelength range | |
| up to 600 nm | up to 600 nm | up to 450 nm | 1-10 nm | 8-400 pm | Simultaneous inspection range | |
| 300-862 nm | 210-800 nm | 190-330 nm | 190-900 nm | 190-550 nm | Wavelength range | |
| 60-172 pm | 23-90 pm | 6-11 pm / 13-24 pm | 2.5-12 pm | 85-240 fm | Resolution FWHM | |
| (210x120x85) mm | (260x160x185) mm | (650x280x250) mm | (750x310x230) mm | (1,400x310x250) mm | Dimensions | |
| 2 kg | 7.3 kg | 20 kg | 25 kg | 50 kg | Weight | |
|
Extremely compact and cost-efficient high-resolution echelle spectrometer for the material / elemental analysis in industry by means of LIBS and Raman spectroscopy
|
Compact high-resolution echelle spectrometer for the material / elemental analysis in industry by means of LIBS and Raman spectroscopy
|
Powerful high-resolution echelle spectrometer for the material and elemental analysis with LIPS and Raman spectroscopy in industry and science.
|
Very high resolution and optical throughput for the production and quality control of diode and solid state lasers
|
Highest-resolution commercial spectrometer series, for the characterization of lasers in the microlithography
|
||
